Name
JIACO Instruments
What We Do
JIACO Instruments Microwave Induced Plasma (MIP) decapsulation is the new standard for reliable Failure Analysis and Quality Control. The fully automated process is highly selective; critical failure sites in advanced packages (e.g. SiP, WLCSP, 2.5D, 3D) are retained without process-induced damage to challenging materials and structures, such as Ag and Cu bond wire, GaAs, Cu RDL, BOAC, SAW/BAW filters.
The JIACO Instruments MIP system has been in the market since mid-2016 and is now in use by many renown global companies for reliable failure analysis and quality control.
At ISTFA 2023 JIACO Instruments will be:
-Present in the 'Tools of the Trade' tour where you will hear how you can use MIP to expose and preserve the original failure sites for critical failure analysis
-At booth 507 during the exhibition
We look forward to speaking with you at ISTFA 2023!
Founded
2014
Phone
0031625261648
Address
Feldmannweg 17
Delft, Netherlands 2628CT
Netherlands

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